C12 - Hard X-ray Imaging With Multilayer Zone Plates

  1. Suchbegriff Mit Google™ suchen Interne Suche nutzen

    (eingeschränkte Ergebnisqualität)

  2. Home
  3. Projects
  4. Events
  5. News
  6. Members
  7. Publications
  8. Gender Equality
  9. Links
  10. Contact
Menü Menü
  1. Home
  2. Projects
  3. Events
  4. News
  5. Members
  6. Publications
  7. Gender Equality
  8. Links
  9. Contact
Suchbegriff Suchbegriff Mit Google™ suchen Interne Suche nutzen (eingeschränkte Ergebnisqualität). Suche starten

Mit der Nutzung der Google™ Suche stimmen Sie den Datenschutzbestimmungen von Google™ zu

Auf der Suche nach Personen, Veranstaltungen oder Räumen ? Zum eCampus Schließen
  1. Startseite
  2. Projects
  3. C12 - Hard x-ray imaging with multilayer zone plates
Suchen English C12 - Hard x-ray imaging with multilayer zone plates

The main goal of the proposed project is the design, fabrication, and application of multilayer zone plates (MZPs) for two-dimensional hard x-ray imaging with resolutions of 10nm and below. Using MZPs, we already have demonstrated sub-5nm point focusing of hard x-rays, and preliminary results show the possibility of high-resolution imaging (collaboration of C01 and C04). Methods developed in the projects C01, C04 and C05 (which in the first period concentrated on "optimized focusing of hard x-rays by nanostructures") will be joined in the new project C12 to further advance from nano-focusing to high resolution imaging using hard x-rays. Members of this project: Dr. Markus Osterhoff M.Sc.Jakob Soltau Publications: Markus Osterhoff, Florian Döring, Christian Eberl, Robin Wilke, J. Wallentin, Hans-Ulrich Krebs, M. Sprung, Tim Salditt (2015) Progress on multi-order hard x-ray imaging with multilayer zone plates Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 9592, DOI:10.1117/12.2187799 Eberl C.; Osterhoff, M. Döring. F.; Krebs. H.-U. (2015) MZP design and fabrication for efficient hard x-ray nano-focusing and imaging Proc. SPIE 9588, Advances in X-Ray/EUV Optics and Components X, DOI:10.1117/12.2187788 Osterhoff, M., Eberl, C., Döring, F., Wilke, R., Wallentin, J., Krebs, H., Sprung, M. and Salditt, T. (2015) Towards multi-order hard x-ray imaging with multilayer zone plates J. Apply. Cryst.open access,, 48: 116-124, DOI:10.1107/S1600576714026016 Döring, F., Robisch, A., Eberl, C., Osterhoff, M., Ruhland, A., Liese, T., Schlenkrich, F., Hoffmann, S., Bartels, M., Salditt, T. and Krebs, H. U. (2013) Sub-5 nm hard x-ray point focusing by a combined Kirkpatrick-Baez mirror and multilayer zone plate Opt. Express, 21(16): 19311, DOI:10.1364/OE.21.019311 Eberl, C., Döring, F., Liese, T., Schlenkrich, F., Roos, B., Hahn, M., Hoinkes, T., Rauschenbeutel, A., Osterhoff, M., Salditt, T. and Krebs, H.-U. (2014) Fabrication of laser deposited high-quality multilayer zone plates for hard X-ray nanofocusing Appl. Surf. Sci., 307: 638-644, DOI:10.1016/j.apsusc.2014.04.089 Eberl, C., Liese, T., Schlenkrich, F., Döring, F., Hofsäss, H. and Krebs, H.-U. (2013) Enhanced resputtering and asymmetric interface mixing in W/Si multilayers Appl. Phys. A, 111(2): 431-437, DOI:10.1007/s00339-013-7587-5 Osterhoff, M., Morawe, C., Ferrero, C. and Guigay, J.-P. (2013) Optimized x-ray multilayer mirrors for single nanometer focusing Opt. Lett., 38(23): 5126-9 Osterhoff, M., Morawe, C., Ferrero, C. and Guigay, J.-P. (2012) Wave-optical theory of nanofocusing x-ray multilayer mirrors. Opt. Lett., 37(17): 3705-7 Osterhoff, M. and Salditt, T. (2011) Partially coherent x-ray beam simulations: mirrors and more Adv. Comput. Methods X-Ray Opt. IISPIE,(1): 81410C-81410C-10, DOI:10.1117/12.893003 Osterhoff, M. and Salditt, T. (2011) Coherence filtering of x-ray waveguides: analytical and numerical approach New J. Phys.open access,, 13(10): 103026, DOI:10.1088/1367-2630/13/10/103026 Röder, J., Liese, T. and Krebs, H.-U. (2010) Material-dependent smoothing of periodic rippled structures by pulsed laser deposition J. Appl. Phys., 107(10): 103515, DOI:10.1063/1.3388591 Osterhoff, M. and Salditt, T. (2009) Real structure effects in X-ray waveguide optics: The influence of interfacial roughness and refractive index profile on the near-field and far-field distribution Optics Communications, 282(16): 3250 - 3256, DOI:DOI: 10.1016/j.optcom.2009.05.008

A01 (Egner) A03 (Rehfeldt/Schmidt/Wardetzky) A04 (Munk/Luke) A05 (Enderlein/Grubmüller) A06 (Munk/Egner) A07 (Munk/Hell) B03 (Techert) B04 (Grubmüller) B07 (Köster) B08 (Rehfeldt/Krivobokova/Hucke-mann) B10 (Jakobs/Techert) C01 (Salditt) C02 (Hohage/Luke) C04 (Mann) C08 (Mann/Ropers) C09 (Hohage) C10 (Salditt/Köster) C11 (Plonka-Hoch) C12 (Osterhoff/Krebs) INF (Osterhoff/Yahyapour)

Từ khóa » X-ray C12