Chip Power-Frequency Scaling In 10/7nm Node - IBM Research
Abstract
The 10/7nm node has been introduced by all major semiconductor manufacturers (Intel, TSMC, and Samsung Electronics). This article looks at the power-performance benefit of the 10/7nm node as compared to the previous node (14nm). Specifically, we track the power-performance in high performance space, using Intel's Core-i7 (Intel's highest performance consumer microprocessor that uses the highest performance CMOS technology node) manufactured in Intel's 10nm. The paper first looks at the scaling of the device power-performance from the Intel 14++nm node to Intel 10nm, using 3D TCAD simulation with dimensions obtained from actual product cross-sections, and also scaling of the interconnect capacitance node-to-node. Next, the paper does a comparison of industry 10/7nm node technologies (from Intel, TSMC, and Samsung Electronics). The paper argues that for Intel, in the 10nm nodes, the total chip power at constant frequency (energy-per-operation) has scaled by a much lower amount vs. the 14++ node, as compared to the 14++ vs. the previous (22 nm) node. The lack of power scaling can be traced to a reduction in current per device perimeter (caused by the increased device parasitic resistance and the reduced device and fin pitch) and to an increase in capacitance per fin (caused by an increase in the FinFET height). Proper scaling of the device is critical for chip power scaling (energy-per-operation) at upcoming nodes, especially as it applies to high performance microprocessors and for the data analyzed here this is not the case.
Related
PaperTheoretical determination of the temporal and spatial structure of α-particle induced electron-hole pair generation in silicon
Phil Oldiges, Robert Dennard, et al.
IEEE TNS
PaperSingle-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
David F. Heidel, Kenneth P. Rodbell, et al.
IEEE TNS
Conference paperSimulation study on channel length scaling of high performance partially depleted metal gate and poly gate SOI MOSFETs
Wang Xinlin, Andres Bryant, et al.
SISPAD 2006
PaperModeling single-event upsets in 65-nm silicon-on-insulator semiconductor devices
A.J. KleinOsowski, Phil Oldiges, et al.
IEEE TNS
View all publications- Home
- Publications
Date
01 Jan 2020Publication
IEEE AccessAuthors
- Phil Oldiges
- Reinaldo A. Vega
- H. Utomo
- Nicholas A. Lanzillo
- Thomas Wassick
- Juntao Li
- Junli Wang
- Ghavam Shahidi
Resources
- Download
- Publication
Share
Từ khóa » Chip 7nm Ibm
-
IBM Unveils World's First 2 Nanometer Chip Technology, Opening A ...
-
IBM's Newest Chip Is More Than Meets The AI | IBM Research Blog
-
IBM Sues GlobalFoundries Over Dropping 7nm, Demands $2.5bn
-
IBM Says It Has Created The World's First 2nm Chip - Engadget
-
Why IBM Is Suing GlobalFoundries Over Chip Roadmap Failures
-
How IBM India Designed A 7nm Enterprise Chip, And Why It's Good ...
-
IBM Creates First 2nm Chip - AnandTech
-
IBM's Two-Nanometer Transistor Could Be The Key To Reviving ...
-
IBM's First 7nm Power10 Chip Arrives In E1080 Server System With A ...
-
IBM Breakthrough Leads To First 5-nm Chip | C&EN Global Enterprise
-
IBM's 2 Nm Transistor Breakthrough Puts Chip Design Under The ...
-
IBM Unveils World's First 2nm Chip Technology That Is Said To Be 45 ...
-
IBM Shows First 2nm Chip - EeNews Europe
-
IBM Reveals Groundbreaking 2nm Chip - With DNA Strand ... - The Stack