Surface Analysis Instruments And Equipment | PHI

Contact Select OneUnited States of AmericaAfghanistanAlbaniaAlgeriaAmerican SamoaAndorraAngolaAntigua and BarbudaArgentinaArmeniaAustraliaAustriaAzerbaijanBahamasBahrainBangladeshBarbadosBelarusBelgiumBelizeBeninBhutanBoliviaBosnia and HerzegovinaBotswanaBrazilBrunei DarussalamBulgariaBurkina FasoBurundiCambodiaCameroonCanadaCape VerdeCentral African RepublicChadChileChinaCocos (Keeling) IslandColombiaComorosCongo, Democratic Republic ofCook IslandsCosta RicaCote d'IvoireCroatiaCubaCyprusCzech RepublicDenmarkDjiboutiDominicaDominican RepublicEast TimorEcuadorEgyptEl SalvadorEquatorial GuineaEritreaEstoniaEthiopiaFijiFinlandFranceFrench GuianaFrench PolynesiaGabonGambiaGeorgiaGermanyGhanaGreeceGreenlandGrenadaGuamGuatemalaGuineaGuinea-BissauGuyanaHaitiHondurasHong KongHungaryIcelandIndiaIndonesiaIranIraqIrelandIsraelItalyJamaicaJapanJordanKazakhstanKenyaKiribatiKorea, NorthKorea, SouthKuwaitKyrgyzstanLaosLatviaLebanonLesothoLiberiaLibyaLiechtensteinLithuaniaLuxembourgMacauMacedoniaMadagascarMalawiMalaysiaMaldivesMaliMaltaMarshall IslandsMauritaniaMauritiusMayotteMexicoMicronesiaMoldovaMonacoMongoliaMontenegroMoroccoMozambiqueMyanmarNamibiaNauruNepalNetherlandsNew CaledoniaNew ZealandNicaraguaNigerNigeriaNorfolk IslandNorthern Mariana IslandsNorwayOmanPakistanPalauPalestinian Territory, OccupiedPanamaPapua New GuineaParaguayPeruPhilippinesPitcairn IslandPolandPortugalPuerto RicoQatarRomaniaRussiaRwandaSaint HelenaSaint Kitts and NevisSaint LuciaSaint Vincent and the GrenadinesSamoaSan MarinoSao Tome and PrincipeSaudi ArabiaSenegalSerbiaSeychellesSierra LeoneSingaporeSlovakiaSloveniaSolomon IslandsSomaliaSouth AfricaSpainSri LankaSudanSurinameSwazilandSwedenSwitzerlandSyriaTaiwanTajikistanTanzaniaThailandTogoTongaTrinidad and TobagoTunisiaTurkeyTurkmenistanTuvaluUgandaUkraineUnited Arab EmiratesUnited KingdomUnited States of AmericaUruguayUzbekistanVanuatuVatican CityVenezuelaVietnamWallis and Futuna IslandsWestern SaharaYemenZambiaZimbabwe Select OneAlabamaAlaskaArizonaArkansasCaliforniaColoradoConnecticutDelawareFloridaGeorgiaHawaiiIdahoIllinoisIndianaIowaKansasKentuckyLouisianaMaineMarylandMassachusettsMichiganMinnesotaMississippiMissouriMontanaNebraskaNevadaNew HampshireNew JerseyNew MexicoNew YorkNorth CarolinaNorth DakotaOhioOklahomaOregonPennsylvaniaRhode IslandSouth CarolinaSouth DakotaTennesseeTexasUtahVermontVirginiaWashingtonWashington DCWest VirginiaWisconsinWyoming Contact Menu Close

• Home
• Products
  • Overview
  • Genesis
  • 710
  • nanoTOF 3
  • Refurbished
  • System Upgrades
  • System Software
    • Overview
    • SmartSoft for VPIII
    • StrataPHI - Software for Thin Film Structure Analysis
    • TOF-SIMS Data Reduction Software
    • SmartSoft for XPS
    • MultiPak Data Reduction Software
• Applications
  • Overview
  • Energy
    • Overview
    • Lithium Battery Electrode Analysis - XPS
    • Fuel Cell Membrane Characterization - XPS
    • Solid Oxide Fuel Cell Characterization - TOF-SIMS
  • Medical
    • Overview
    • Drug Absorption - TOF-SIMS
    • 3D Characterization of a Drug Eluting Coating - TOF-SIMS
  • Polymers
    • Overview
    • Plasma Modified Polymer Surfaces - XPS
    • Contaminant Identification On Polymer Surfaces - Multitechnique
    • Polymer Film Depth Profiling - XPS
    • 3D Polymer Film Depth Profiling - TOF-SIMS
    • Molecular Imaging with High Spatial Resolution and High Mass Resolution (HR²) - TOF-SIMS
  • Thin Films
    • Overview
    • Magnetic Storage Media - Multitechnique
    • Semiconductor Films - AES
    • Organic Electronics - Multitechnique
    • Organic Photovoltaics - TOF-SIMS
    • Graphene Films - XPS
  • Metallurgy
    • Overview
    • Segregation Of Impurities In Ductile Iron - AES
    • Characterizing Tribo-Surface Chemistry - XPS
    • Corrosion Studies - AES
  • Magnetic Media
    • Overview
    • Hard Disk Thin Film Composition - Multitechnique
    • Tribology on Magnetic Media Heads - AES
  • Microelectronics
    • Overview
    • Silicon Nanowires - AES
    • Semiconductor Packaging - XPS
• Techniques
  • Overview
  • XPS/ESCA
  • HAXPES
  • TOF-SIMS
  • AES
  • Surface Analysis Spotlight
• Analytical Services
  • Overview
  • XPS/ESCA/HAXPES
  • TOF-SIMS
  • AES
• Support
  • Overview
  • Support Services
    • Overview
    • Service Contracts
    • Worldwide Factory Service
    • ReACH
    • Parts/Materials Return Declaration
  • Reference Material
    • Overview
    • FAQ
    • Handbook
    • Manuals
    • Safety Data Sheets
  • Software
    • Overview
    • Software Updates
  • Hardware
    • Overview
    • Consumable Parts
    • System Upgrades
  • Customer Care Center

• About Us
  • Overview
  • Our Focus
  • History
  • Leadership
  • Analytical Lab
  • Events
    • Overview
    • AVS 67 Conference Links
    • Past Events
  • News & Articles
  • Careers
• Contact Us

Login Register

Stay Connected

Login Register

• Products
• Applications
• Techniques
• Analytical Services
• Support

• About Us
• Contact Us

Driving Discoveries Through Surface Analysis Thin Film Composition Driving Discoveries Through Surface Analysis Chemical Imaging Driving Discoveries Through Surface Analysis Defect Analysis Driving Discoveries Through Surface Analysis New Materials Development Driving Discoveries Through Surface Analysis Surface Contamination Driving Discoveries Through Surface Analysis Additive Manufacturing Explore Our Products Contract Lab Services What is Surface Analysis?

Recent News & Articles

View All December 4, 2025

Hybrid Sputtering Approach for Reliable TOF-SIMS Depth Profiling of Inorganic-Organic Multilayer Films

Spotlight Series Learn More October 7, 2025

How XPS and TOF-SIMS Advanced Chemical Imaging Uncovers Stabilizing Effects of Engineered Particle (Ep) Battery Cathodes

Spotlight Series Learn More September 9, 2025

How Can X-ray Photoelectron Spectroscopy Be Used to Determine Iron Oxidation State in Metamorphic Fe-Ti-oxides in the Adirondack Mountains, New York?

Spotlight Series Learn More

Upcoming Events

View All 1/7/2026

UKSAF Winter Meeting 2026

Learn More 1/11/2026 - 1/16/2026

15th International Workshop on Oxide Surfaces (IWOX)

Learn More 1/15/2026

UW-Madison Facilities Day

Learn More

Our Customers

What Our Customers Say

“The PHI Genesis X-ray Photoelectron Spectroscopy (XPS) instrument has revolutionized our lab's capabilities. Its advanced features and flexibility enable detailed surface material analysis, while PHI's exceptional support ensures smooth operations. The seamless installation and insightful training provided by PHI's knowledgeable field engineers have made this system an invaluable addition to our facilities.”

Quantum Valley Ideas Lab

“PHI's service team is exceptional. Their engineers are professional, reliable, and knowledgeable, always seeking help when needed to ensure reliability. The scientists are equally impressive, providing clear guidance for analysis. PHI's customer service is amazing.”

NY CREATES

“As a global supplier in the automotive, aerospace, and industrial markets, we rely on PHI Auger instruments for customer support, production, and R&D. The PHI 710 Auger, with its state-of-the-art capabilities and excellent customer support, continues to drive our product and process development. The expertise of PHI's service engineers and scientists, along with the flexibility to add specific capabilities, strengthens our long-standing relationship with PHI.”

Manufacturing Customer

“PHI's prompt and willing responses to our VersaProbe system and data analysis concerns have been invaluable. Their excellent application support ensures we always have the help we need.”

University of Virginia

“PHI's TOF-SIMS studies were instrumental in resolving a major issue in our products. Their expertise helped us identify the compromised film, enabling us to successfully address the problem. PHI's support was a significant contributor to our success.”

Semiconductor Contract Customer

“We are very pleased with the timely assistance our users have received from PHI's application department over the past six years. The experienced application scientists provide invaluable tips and share application materials promptly, often on the same day. PHI's support has been crucial in expanding our user base and exploring new applications on the system.”

Seagate

"PHI has proven to be an excellent choice for both instrumentation and service. Their high-quality instruments offer long-term reliability, and their professional service team is outstanding—dedicated engineers, quick response times, effective solutions, and dependable access to spare parts with fast delivery."

Materiex AB

"I've worked with PHI instruments for over 20 years, and our department's 45 year relationship with PHI speaks volumes. Their consistent service and support have been invaluable, and we look forward to continuing this trusted partnership."

University of the Free State

Previous Next

Stay Connected

18725 Lake Drive East, Chanhassen, MN 55317 © 2025 Physical Electronics, Inc. (PHI) All Rights Reserved.

• Contact
• Login
• Careers
• Privacy Policy
• Sitemap
• ULVAC-PHI, INC

© 2025 Physical Electronics, Inc. (PHI) All Rights Reserved. Cookies