Surface Analysis PHI5600 - MCPF - Service

Surface Science

• Surface Analysis Kratos Axis Supra+
• Surface analysis Kratos Axis Ultra
• TOF SIMS V

Scanning Probe Microscopy

• Scanning Probe Microscope_Dimension ICON

X-Ray Diffraction

• Multi-purpose XRD
• Panalytical Empyrean MultiCore PIX3D
• Powder X-ray diffractometer_PANalytical

Nuclear Magnetic Resonance

• Varian NMR spectrometer

Thin Film

• Evaporation system - Explorer 14
• KLA-Tencor Alpha-Step Stylus Profiler
• Sputtering system-Explorer
• Thin Film Sputtering System-Denton

Optical Characterisation

• Bruker FTIR
• Ellipsometer_Woollam
• MicroRaman/Photoluminescence System
• Near-field Imaging/Spectroscopy
• Renishaw inVia Qontor Spectrometer System
• UV-VIS-NIR Spectrophotometer

Electrical/Magnetic Characterisation

• Cryostat
• Electrochemical Analyzer
• Hall effect measurement system

Thermal Analysis

• Discovery DSC 2500
• DSC TA Q1000
• Simultaneous Thermal Analyzer (STA)
• TGA Q5000
• TGA-5500
• TGA/DTA Setaram
• Thermal conductivity_Discovery

Sample Preparation-General

• Band Saw_Allied
• Centorr High Temp Vacuum Furnace
• Diamond Saw1_4
• Diamond Wheel Saw 4' II
• Electric Balance
• Glass Maker
• Hand Polishing Equipment
• High Speed Digital Camera
• High Temperature Furnace
• High Temperature Furnance II
• Image Analysis System Q600
• Mechanical Polish/Lapping Equipment III
• Metallurgical Microscope and Image Analysis System Q500
• Microhardness Tester
• Olympus Optical Microscopy
• Polisher1_8
• Precision wire saw
• Rotary Microtome
• Sample mounting
• Sieve shaker
• Sliding Microtome
• Vacuum oven
• Wire Saw

Sample Preparation-Electron_Microscopy

• Abrasive Slurry Disc Cutter
• Carbon Coater
• Cooling Cross Section Polisher
• Dimpler grinder
• Fischione Ion Miller
• Gold Sputter Coater
• Ion Beam Miller 691
• Platinum Sputter Coater_Quorum
• Ultrasonic Disk Cutter

Element Analysis

• X-ray fluorescence spectrometer (XRF)

Nano Fabrication

• Desktop sputtering system
• Dual Beam FIB/SEM
• E-beam Evaporation System-Peva
• E-beam for metal
• E-beam for oxide
• e-LiNE
• Focused Ion Beam (II)
• Optical microscope
• Oven
• Physical Property Measurement System
• Plasma cleaner
• RIE-ICP Etcher
• Spin Coater and Hot Plate
• UV Direct Writer
• Wedge bonder (AB520)
• Wedge bonder (AB550)

Liquid Helium Plant

• Helial Liquefaction System
• Helium Liquefier System

Scanning Electron Microscopy-SEM

• Environmental SEM
• JEOL-6390 SEM
• JEOL-6700F SEM
• JEOL-7100F SEM
• JEOL-7800F SEM
• JSM-IT800 SHL SEM

Transmission Electron Microscopy-TEM

• Aberration Corrected TEM
• JEOL 2010F TEM
• Talos F200X G2 S/TEM

Surface analysis PHI5600 Model: PHI 5600 (Physical Electronics) Status: Disposed Location: 2211 Description: Model PHI 5600 (Physical Electronics), multi-technique system (AES, SAM, XPS) © The Hong Kong University of Science and Technology. All rights reserved. Privacy Policy