X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci Spectrometer)

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X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci spectrometer)

Home / Equipment and processes available / Characterization / Spectrometric and spectroscopic analysis / X-ray Photoelectron Spectroscopy (xps)(PHI 5600-ci spectrometer)

Additional information

MANUFACTURER	Physical Electronics
MODEL	PHI 5600-ci spectrometer

Analysis

• Analysis of surface composition
• Depth sampled: 2 to 10 nm
• Elements observed : from Lithium

Characteristics

• Surface descum possible
• Variable angle analysis
• Analyzed area: from 300 µm2 to 0.8 mm2

Use this equipment Categories: Characterization, Spectrometric and spectroscopic analysis Tag: X-Ray photoelectron spectroscopy (XPS)

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To use this equipment

The equipment available is accessible to the academic and industrial research community.

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